Hard-to-Detect Fault Analysis in FinFET SRAMs
نویسندگان
چکیده
منابع مشابه
SOFT-ERROR SUSCEPTIBILITY OF FinFET SRAMs
INTRODUCTION For technology scaling beyond 20 nm, FinFET transistors will replace the conventional planar geometry. The driving force for the introduction of FinFET architecture is the superior immunity to short-channel effects and the reduction of the effects of process variation on device performance exhibited by the FinFET.[1-4] Figure 1 shows a comparison of architectures of the planar FET ...
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ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2021
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2021.3071940